Vaiseshika introduces the new versatile microscope with multiple examination facilities, Type: 7002 MIM. Microscopic observation of samples with the provision of localized illumination renders this microscope an excellent diagnostic tool in the hand of design and development engineers in different industries and national laboratories. A smooth rack and pinion arrangement is provided to obtain vertical up and down movement of the microscope objective and eye-piece. This microscope can even be taken to the field to examine variety of samples. A 10x micrometer eye-piece is also provided as an accessory with the microscope. The micrometer eye piece is graduated along X-Axis and provides a least count of 0.01cm in measurement. Fibres and threads in textile industry can be examined more accurately with micrometer eye piece. Similarly any optical observation and simultaneous measurement can be obtained with this eye piece. This microscope has proved an excellent inspection system for colour picture tube manufacturers.